PARK SYSTEMS / TECNOLOGÍA AFM /


Park NX20

As an FA engineer, you’re expected to deliver results. There’s no room for error in the data provided by your instruments. Park NX20, with

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Park NX10

Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and

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Park XE15

The Park XE15 includes many unique capabilities that make it ideal for shared labs that handle a diverse range of samples, researchers doing multi variant

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Park XE7

Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same

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Park XE-3DM

Park Systems has introduced the revolutionary XE-3DM, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging,

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Park HDM Series NX-HDM | XE-HDM

The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic

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Park PTR Series NX-PTR | XE-PTR

Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on

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Park Wafer Series NX-Wafer | XE-Wafer

Park's Smart ADR provides fully automated defect review and identification, enabling a critical inline process to classify defect types and source

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Park XE-Bio

Park XE-Bio is a powerful 3-in-1 bio-research tool that uniquely combines Scanning Ion Conductance Microscopy (SICM) with AFM and inverted optical

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