PARK SYSTEMS / TECNOLOGÍA AFM / INDUSTRIAL AFM /


Park XE-3DM

Park Systems has introduced the revolutionary XE-3DM, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging,

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Park HDM Series NX-HDM | XE-HDM

The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic

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Park PTR Series NX-PTR | XE-PTR

Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on

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Park Wafer Series NX-Wafer | XE-Wafer

Park's Smart ADR provides fully automated defect review and identification, enabling a critical inline process to classify defect types and source

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